Tuned artificial contrasts to detect signals

被引:19
作者
Hu, J. [1 ]
Runger, G.
Tuv, E.
机构
[1] Arizona State Univ, Tempe, AZ 85287 USA
[2] Intel Corp, Chandler, AZ 85226 USA
基金
美国国家科学基金会;
关键词
Multivariate SPC; artificial contrasts; classification;
D O I
10.1080/00207540701325330
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Quick detection of shifts under specific faults in multivariate statistical process control has been of interest. Process knowledge can be exploited to design a control chart to be sensitive to more specific mean shifts. Out-of-control observations are simulated representing the shifts resulted from the specific faults and thus the detection problem is converted to a supervised learning task. A control region can be learned through the classifier. The effectiveness of this approach is shown here through graphical illustrations in comparison with the results from normal theory and error rate tables.
引用
收藏
页码:5527 / 5534
页数:8
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