Multi-class classification averaging fusion for detecting steganography

被引:0
作者
Rodriguez, Benjamin M. [1 ]
Peterson, Gflbert L. [1 ]
Agaian, Sos S. [2 ]
机构
[1] AF Inst Technol, Dept Elect & Comp Engn, Wright Patterson AFB, OH USA
[2] Univ Texas, Dept Elect & Comp Engn, Multimedia & Mobile Sig Lab, San Antonio, TX USA
来源
2007 IEEE INTERNATIONAL CONFERENCE ON SYSTEM OF SYSTEMS ENGINEERING, VOLS 1 AND 2 | 2007年
关键词
fusion system; multi-class classification; steganography; steganalysis;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Multiple classifier fusion has the capability of increasing classification accuracy over individual classfier systems. This paper focuses on the development of a multi-class classification fusion based on weighted averaging of posterior class probabilities. This fusion system is applied to the steganography fingerprint domain, in which the classifier identifies the statistical patterns in an image which distinguish one steganography algorithm from another. Specifically, we focus on algorithms in which jpeg images provide the cover in order to communicate covertly. The embedding methods targeted are F5, JSteg, Model Based, OutGuess, and StegHide. The developed multi-class steganalysis system consists of three levels: (1) feature preprocessing in which a projection function maps the input vectors into a separable space, (2) classfier system using an ensemble of classifiers, and (3) two weighted fusion techniques are compared, the first is a well known variance weighted fusion and an Gaussian weighted fusion. Results show that through the novel addition of the classfier fusion step to the multi-class steganalysis system, the classification accuracy is improved by up to 12%.
引用
收藏
页码:505 / +
页数:2
相关论文
共 23 条
[1]  
AGAIAN S, 2004, 2004 INT WORKSH SPEC
[2]  
[Anonymous], OUTGUESS
[3]   On the impact of fusion strategies on classification errors for large ensembles of classifiers [J].
Cabrera, Joao B. D. .
PATTERN RECOGNITION, 2006, 39 (11) :1963-1978
[4]  
Cristianini N., 2000, Intelligent Data Analysis: An Introduction
[5]   MAXIMUM LIKELIHOOD FROM INCOMPLETE DATA VIA EM ALGORITHM [J].
DEMPSTER, AP ;
LAIRD, NM ;
RUBIN, DB .
JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES B-METHODOLOGICAL, 1977, 39 (01) :1-38
[6]  
Duda RO, 2006, PATTERN CLASSIFICATI
[7]  
DUIN RPW, 2000, P 1 INT WORKSH MCS
[8]  
GOEBEL K, CHOOSING CLASSIFIERS
[9]   Multiple classifier fusion in probabilistic neural networks [J].
Grim, J ;
Kittler, J ;
Pudil, P ;
Somol, P .
PATTERN ANALYSIS AND APPLICATIONS, 2002, 5 (02) :221-233
[10]  
KITTLER J, 2002, LECT NOTES COMPUTER, V1876, P45