Proton-induced degradation in high-resolution Geiger tracking detectors

被引：0

作者：

Vasile, Stefan ^{[1
]}

机构：

[1] Peak Inc, Newton, MA 02466 USA

来源：

2006 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOL 1-6 | 2006年

关键词：

D O I：

10.1109/NSSMIC.2006.356129

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We developed high-resolution, high- internal gain (10(6)) charged-particle tracking silicon active-pixel detector arrays operated in Geiger mode (GAPS) for microvertex applications. In this paper we verify the radiation tolerance of GAPS detectors after irradiation with 55 MeV protons up to 3x10(11) p/cm(2). We confirm 100% detection efficiency of charged particle events before and after irradiation. The dark count rate increases from 1KHz to 6 KHz at room temperature after irradiation with protons up to 1x10(11) p/cm(2), and anneals at a rate of 0.32%/day.

引用

页码：158 / 160

页数：3