Spatial light modulator phase depth determination from optical diffraction information

被引：12

作者：

McClain, JL ^{[1
]}

Erbach, PS ^{[1
]}

Gregory, DA ^{[1
]}

Yu, FTS ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT ELECT ENGN,UNIVERSITY PK,PA 16802

来源：

OPTICAL ENGINEERING | 1996年 / 35卷 / 04期

关键词：

spatial light modulator; phase modulation; diffraction;

D O I：

10.1117/1.600704

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal based modulator. (C) 1996 Society of Photo-Optical Instrumentation Engineers.

引用

页码：951 / 954

页数：4