Graphene oxide-based non-volatile organic field effect memory transistors

被引:7
作者
Alaabdlqader, Homod S. [1 ]
Sleiman, Adam [1 ]
Sayers, Paul [1 ]
Mabrook, Mohammed F. [1 ]
机构
[1] Bangor Univ, Sch Elect Engn, Bangor LL57 1UT, Gwynedd, Wales
关键词
graphene; organic field effect transistors; random-access storage; nanoparticles; dielectric materials; polymers; organic compounds; thin film transistors; semiconductor device reliability; graphene oxide-based non-volatile organic field effect memory transistor; GO nanoparticle; floating gate; dielectric polymethylmethacrylate; pentacene; organic semiconductor; current-voltage characteristics; organic thin film memory transistor; GO-based memory transistor; reliability; reduced charge leakage; transfer characteristics; C; FILM; SILICON;
D O I
10.1049/iet-cds.2014.0064
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To produce organic non-volatile organic memory transistors, graphene oxide (GO) nanoparticles were embedded in the floating gate of an all organic memory structure using polymethylmethacrylate as the dielectric and pentacene as the organic semiconductor. The current-voltage characteristics and the memory behaviour of the GO-based organic thin film memory transistors are reported. GO-based memory transistors were shown to produce reliable and large memory windows by virtue of high capacity and reduced charge leakage. The hysteresis in the output and transfer characteristics and shifts in the threshold voltage of the transfer characteristics were attributed to the charging and discharging of the floating gate. Fast switching and large memory windows (approximate to 26 V) exhibiting high charge density (6.25 x 10(12) cm(-2)) were achieved.
引用
收藏
页码:67 / 71
页数:5
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