Large dynamic range 64-channel ASIC for CZT or CdTe detectors

被引:5
作者
Glasser, F [1 ]
Villard, P [1 ]
Rostaing, JP [1 ]
Accensi, M [1 ]
Baffert, N [1 ]
Girard, JL [1 ]
机构
[1] CEA, GRE, CEA LETI Technol Advances, F-38054 Grenoble 9, France
关键词
pixel detector; ASIC; CdTe; CZT;
D O I
10.1016/S0168-9002(03)01569-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present a customized 64-channel ASIC, named ALIX, developed in a 0.8 mum CMOS technology. This circuit is dedicated to measure charges from semi-conductor X-ray detectors like Cadmium Zinc Telluride (CZT) or Cadmium Telluride CdTe. The specificity of ALIX is to be able to measure charges over a very large dynamic range (from 10 fC to 3 nC), and to store eight measurements in a very short time (from every 250 ns to a few ms). Up to eight images are stored inside the ASIC and each image can be read out in 64 mus. A new acquisition sequence can then be started. Two analog readouts are available, one for the X-ray signal and one for the offset and afterglow measurement in case of pulsed X-rays. The outputs are converted into digital values by two off-chip 14 bits Analog-to-Digital Converters (ADC). A first version of ALIX has been tested with CZT and CdTe detectors under high-energy pulsed X-ray photons (20 MeV, 60 ns pulses every 250 ns). We will present the different results of linearity and signal-to-noise ratio. A second version of ALIX has been designed with some corrections. Electrical tests performed on 85 ASICS showed that the corrections were successful. We are now able to integrate them behind a 64 x 32 pixels 1 mm pitch CZT detector. Such an ASIC could also be used for strip detectors where a large dynamic range and a fast response are necessary. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:183 / 190
页数:8
相关论文
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[1]   CdZnTe high-energy radiography detector [J].
Glasser, F ;
Gerbe, V ;
Ouvrier-Buffet, P ;
Accensi, M ;
Girard, JL ;
Renaud, M ;
Gersten-mayer, JL .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 458 (1-2) :544-550