RepMet: Representative-based metric learning for classification and few-shot object detection

被引:273
作者
Karlinsky, Leonid [1 ]
Shtok, Joseph [1 ]
Harary, Sivan [1 ]
Schwartz, Eli [1 ]
Aides, Amit [1 ]
Feris, Rogerio [1 ]
Giryes, Raja [2 ]
Bronstein, Alex M. [3 ]
机构
[1] IBM Res AI, Yorktown Hts, NY 10598 USA
[2] Tel Aviv Univ, Tel Aviv, Israel
[3] Technion, Haifa, Israel
来源
2019 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2019) | 2019年
基金
欧盟地平线“2020”;
关键词
D O I
10.1109/CVPR.2019.00534
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Distance metric learning (DML) has been successfully applied to object classification,both in the standard regime of rich training data and in the few-shot scenario, where each category is represented by only a few examples. In this work, we propose a new method for DML that simultaneously learns the backbone network parameters,the embedding space, and the multi-modal distribution of each of the training categories in that space, in a single end-to-end training process. Our approach outperforms state-of-the-art methods for DML-based object classification on a variety of standard fine-grained datasets. Furthermore, we demonstrate the effectiveness of our approach on the problem of few-shot object detection, by incorporating the proposed DML architecture as a classification head into a standard object detection model. We achieve the best results on the ImageNet-LOC dataset compared to strong baselines, when only a few training examples are available. We also offer the community a new episodic benchmark based on the ImageNet dataset for the few-shot object detection task.
引用
收藏
页码:5192 / 5201
页数:10
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