Morphological instabilities during growth of a rough interface: AFM observations of cobbles on the (0001) face of synthetic quartz crystals

被引：19

作者：

Kawasaki, M ^{[1
]}

Onuma, K ^{[1
]}

Sunagawa, I ^{[1
]}

机构：

[1] Natl Inst Adv Ind Sci & Technol, Inst Human Sci & Biomed Engn, Tsukuba, Ibaraki 3058562, Japan

来源：

JOURNAL OF CRYSTAL GROWTH | 2003年 / 258卷 / 1-2期

关键词：

atomic force microscopy; characterization; crystal morphology; morphological stability; hydrothermal crystal growth; quartz;

D O I：

10.1016/S0022-0248(03)01509-4

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Atomic force microscopy (AFM) observations and profile measurements by a three-dimensional measuring system were carried out on the surface microtopographs of the r, z, m, and Z faces of synthetic quartz crystals, and the differences of growth mechanism between smooth and rough interfaces were examined. We demonstrated that the r, z, and m faces grow by a spiral growth mechanism, whereas the Z face grows by an adhesive-type mechanism. We found that the formation of cobbles on the Z face is due to morphological instability, and the step-like patterns observed on type 11 cobbles appear due to the instability generated by mixed dislocations. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：188 / 196

页数：9

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