Optical and Structural Properties of a-SiC:H prepared by Hot-wire CVD Technique at Various Gas Flow

被引:0
作者
Azis, A. [1 ]
Rahman, S. A. [1 ]
机构
[1] Univ Malaya, Fac Sci, Dept Phys, Kuala Lumpur 50603, Malaysia
来源
INTERNATIONAL CONFERENCE ON ADVANCEMENT OF MATERIALS AND NANOTECHNOLOGY 2007 | 2010年 / 1217卷
关键词
Optical; Structural; a-SiC:H; Hot-wire CVD; Gas Flow; CHEMICAL-VAPOR-DEPOSITION; THIN-FILMS; SILICON; GROWTH; RATES;
D O I
10.1063/1.3377889
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
a-SiC:H films were prepared using a home-built hot-wire chemical vapor deposition (HW-CVD) system. Silane and methane gases were used as source gases and were allowed to flow into the chamber at different flow rate ratios. The a-SiC:H films were deposited on pre-heated crystal silicon and glass substrates. FTIR spectra shows the existence of Si-C stretching bond for all samples with its intensity is obviously higher for a-SiC:H films prepared at higher methane to silane gas flow rate ratios. The increment of methane to silane gas flow rate ratio has enhanced the formation of Si-C bonds and thus increasing the optical energy gap (E-g) consistently. High methane to silane gas flow rate ratio also resulted in rapid growth of a-SiC:H films. Raman spectra show evidence of amorphous Si (a-Si) structure in all samples. Study shows that the optical and structural properties of a-SiC:H film was highly influenced by different gas flow rate ratio of the source gases.
引用
收藏
页码:58 / 64
页数:7
相关论文
共 12 条
[1]   Influences of carbon content and power density on the PECVD grown a-Si1-x:Cx:H thin films [J].
Akaoglu, B. ;
Gulses, A. ;
Atilgan, I. ;
Katircioglu, B. .
VACUUM, 2006, 81 (01) :120-125
[2]   Effects of RF power and annealing on the electrical and structural properties of sputtered amorphous silicon carbide films [J].
Choi, WK ;
Chong, NB ;
Tan, LS ;
Han, LJ .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2000, 72 (2-3) :132-134
[3]   Structure of amorphous and microcrystalline silicon thin films prepared at various gas pressures and gas flow rates by hot-wire chemical vapor deposition [J].
Daimaru, T ;
Tabata, A ;
Mizutani, T .
THIN SOLID FILMS, 2006, 501 (1-2) :102-106
[4]   Transient behavior of adjustable threshold a-Si:H/alpha-SiC:H three-color detector [J].
Irrera, F ;
Lemmi, F ;
Palma, F .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (09) :1410-1416
[5]   FTIR analysis of a-SiC:H films grown by plasma enhanced CVD [J].
Kaneko, Tsutomu ;
Nemoto, Dai ;
Horiguchi, Atsushi ;
Miyakawa, Nobuaki .
JOURNAL OF CRYSTAL GROWTH, 2005, 275 (1-2) :E1097-E1101
[6]   Nanocrystalline cubic silicon carbide films prepared by hot-wire chemical vapor deposition using SiH4/CH4/H2 at a low substrate temperature [J].
Komura, Y. ;
Tabata, A. ;
Narita, T. ;
Kondo, A. ;
Mizutani, T. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (9-20) :1367-1370
[7]   A comparative study of Ar and H2 as carrier gases for the growth of SiC films on Si(100) by electron cyclotron resonance chemical vapor deposition at low temperature [J].
Lee, WH ;
Lin, JC ;
Lee, C ;
Cheng, HC ;
Yew, TR .
DIAMOND AND RELATED MATERIALS, 2001, 10 (11) :2075-2083
[8]   Aluminum-doped hydrogenated microcrystalline cubic silicon carbide films deposited by hot wire CVD [J].
Miyajima, S ;
Yamada, A ;
Konagai, M .
THIN SOLID FILMS, 2006, 501 (1-2) :186-189
[9]   Properties of hydrogenated amorphous silicon carbide films prepared at various hydrogen gas flow rates by hot-wire chemical vapor deposition [J].
Mori, M ;
Tabata, A ;
Mizutani, T .
THIN SOLID FILMS, 2006, 501 (1-2) :177-180
[10]   Microstructure analysis of a-SiC:H thin films grown by high-growth-rate PECVD [J].
Ricciardi, C. ;
Primiceli, A. ;
Germani, G. ;
Rusconi, A. ;
GiorgiS, F. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (9-20) :1380-1383