共 28 条
[1]
CHEMICAL-ANALYSIS OF INORGANIC AND ORGANIC-SURFACES AND THIN-FILMS BY STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS)
[J].
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH,
1994, 33 (10)
:1023-1043
[7]
Grams J, 2005, RUSS J PHYS CHEM+, V79, P1059
[8]
Grams J, 2005, REACT KINET CATAL L, V84, P237
[10]
GRAMS J, 2009, POL J ENVIRON STUD, V18, P49