Surface studies of heterogeneous catalysts by time-of-flight secondary ion mass spectrometry

被引:11
作者
Grams, Jacek [1 ]
机构
[1] Tech Univ Lodz, Inst Gen & Ecol Chem, Ul Zeromskiego 116, PL-90924 Lodz, Poland
关键词
ToF-SIMS; secondary ion mass spectrometry; heterogeneous catalyst; supported catalyst; catalysis; surface characterization; SELECTIVE HYDROGENATION;
D O I
10.1255/ejms.1079
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
The aim of this paper was to present potentialities of time-of-flight secondary ion mass spectrometry (ToF-SIMS) in the studies of heterogeneous catalysts. The results of ToF-SIMS investigations of Co/Al2O3, Mo/Al2O3, Co-Mo/Al2O3, Au/Al2O3, Pt/TiO2 and Pd/TiO2 systems were described. It was demonstrated that, in this case, an application of ToF-SIMS makes possible the determination of surface composition of investigated catalysts (including an identification of surface contaminants), characterization of interactions between an active phase and support, estimation of active phase dispersion on the analyzed surface, comparison of the degree of metal oxidation after treatment of the catalyst in different conditions, investigation of catalyst deactivation processes (formation of new chemical compounds, adsorption of various impurities and poisons on the catalyst surface) and determination of organic precursors of catalysts.
引用
收藏
页码:453 / 461
页数:9
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