Morphological Feature Analysis of Electrical Tree Growth in Epoxy Resin Under Tensile and Compressive Stress

被引:29
作者
Du, B. X. [1 ]
Zhang, Y. [1 ]
Kong, X. X. [1 ]
Liang, H. C. [1 ]
机构
[1] Tianjin Univ, Key Lab Smart Grid, Sch Elect & Informat Engn, Educ Minist, Tianjin 300072, Peoples R China
基金
中国国家自然科学基金;
关键词
Compressive stress; Tensile stress; Epoxy resins; Insulation; Morphology; Fractals; Electrodes; defect; electrical tree; epoxy resin; morphological feature; tensile stress;
D O I
10.1109/TDEI.2022.3146577
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, electrical tree morphological features in epoxy resin under tensile and compressive stress are investigated. The applied tensile and compressive stress varies from 0 to 30 MPa, whose direction is perpendicular to the needle electrode. The obtained results show that the tensile stress accelerates the tree growth, especially in the direction parallel to the tensile stress. With the increasing compressive stress, both the tree length and the corresponding accumulated damage decrease first and subsequently increase. By comparing the tree distribution in parallel and vertical directions, it is found that the tree mainly propagates to the ground electrode under the compressive stress. A tree growth curve is proposed to explain the experimental results, which reveals the defect generation and the tree propagation driven by both electrical and mechanical stresses. The growth curve can predict the tree-induced dielectric breakdown in epoxy resin under mechanical stress.
引用
收藏
页码:343 / 346
页数:4
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