Detection and Masking of Trojan Circuits in Sequential Logic

被引：0

作者：

Matrosova, A. ^{[1
]}

Mitrofanov, E. ^{[1
]}

Ostanin, S. ^{[1
]}

Nikolaeva, E. ^{[1
]}

机构：

[1] Tomsk State Univ, Tomsk, Russia

来源：

2017 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS) | 2017年

基金：

俄罗斯科学基金会;

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A technique of finding a set of sequential circuit nodes in which Trojan Circuits (TC) may be implanted is suggested. The technique is based on applying the precise (not heuristic) random estimations of internal node observability and controllability. Getting the estimations we at the same time derive and compactly represent all sequential circuit full states (depending on input and state variables) in which of that TC may be switched on. It means we obtain precise description of TC switch on area for the corresponding internal node v. The estimations are computed with applying a State Transition Graph (STG) description, if we suppose that TC may be inserted out of the working area (out of the specification) of the sequential circuit. Reduced Ordered Binary Decision Diagrams (ROBDDs) for the combinational part and its fragments are applied for getting the estimations by means of operations on ROBDDs. Techniques of masking TCs are proposed. Masking sub-circuits overhead is appreciated.

引用

页数：4

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