Pulsed Photothermal Heating of One-Dimensional Nanostructures

被引:3
作者
Roder, Paden B. [1 ]
Manandhar, Sandeep [1 ,3 ]
Devaraj, Arun [3 ]
Perea, Daniel E. [3 ]
Davis, E. James [2 ]
Pauzauskie, Peter J. [1 ,4 ]
机构
[1] Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA
[2] Univ Washington, Dept Chem Engn, Seattle, WA 98195 USA
[3] Pacific Northwest Natl Lab, Environm Mol Sci Lab, Richland, WA 99354 USA
[4] Pacific Northwest Natl Lab, Phys & Computat Sci Directorate, Richland, WA 99354 USA
基金
美国国家科学基金会;
关键词
ATOM-PROBE TOMOGRAPHY; FIELD-ION EMITTER; THERMAL-CONDUCTIVITY; NUMERICAL-CALCULATION; SILICON NANOWIRES; LIGHT-ABSORPTION; THIN-FILMS; IRRADIATION; EVAPORATION; EVOLUTION;
D O I
10.1021/acs.jpcc.6b04592
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Pulsed lasers are used in tandem with one-dimensional nanostructures in a wide range of contemporary physical chemistry experiments, including four-dimensional transmission electron microscopy, scanning probe microscopy, and laser-assisted atom probe tomography (APT). In this work, closed-form solutions for the pulsed photothermal heating of one-dimensional nanomaterials are compared with experimental time-of-flight APT ion spectra from both amorphous and crystalline silicon targets. Analytical results are given for targets with either a uniform cylindrical morphology or an arbitrary degree of conical tapering. Counterintuitively, increasing a conical specimen's taper-angle is shown to lead to increases in the maximum temperature reached at the tip of the specimen. In particular, the heat source for tapered targets is affected by internal morphology-dependent cavity resonances that increase the maximum tip temperature relative to an untapered cylindrical structure. Experimental time-of-flight ion spectra for both crystalline- and amorphous-silicon specimens are observed to agree with pulsed photothermal heating calculations. The results presented here will be of general use for quantifying photothermal heating experiments including tip-enhanced near-field scanning-probe microscopy, time-resolved electron microscopy, assisted atom probe tomography.
引用
收藏
页码:21730 / 21739
页数:10
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