Achieving Traceability of Industrial Computed Tomography

被引:21
作者
Bartscher, Markus [1 ]
Neukamm, Marko [1 ]
Hilpert, Uwe [1 ]
Neuschaefer-Rube, Ulrich [1 ]
Haertig, Frank [1 ]
Kniel, Karin [1 ]
Ehrig, Karsten [2 ]
Staude, Andreas [2 ]
Goebbels, Juergen [2 ]
机构
[1] Phys Tech Bundesanstalt, Coordinate Metrol Dept, Bundesallee 100, D-38116 Braunschweig, Germany
[2] BAM Bundesanstalt Materialforschung & Prufung, Berlin Nondestruct Testing Dept, D-12205 Berlin, Germany
来源
MEASUREMENT TECHNOLOGY AND INTELLIGENT INSTRUMENTS IX | 2010年 / 437卷
关键词
Industrial Computed Tomography (CT); Coordinate Metrology; Traceability;
D O I
10.4028/www.scientific.net/KEM.437.79
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Achieving traceability is crucial for complex measurement techniques, especially for coordinate measuring machines (CMMs). For CMMs using tactile probes, traceability can for certain measurements be achieved using model-based uncertainty budgets. Up to now, uncertainty simulations could be used applicable only for tactile CMM measurements of regular geometries, but are available as an add-on for different CMMs. This procedure is accepted by guidelines and international standards (VDI/VDE 2617-7, supplement 1 [1] to GUM). Furthermore, empirical approaches to assess the measurement uncertainty by means of calibrated workpieces or prior knowledge exist or are under development. These approaches can as a matter of principle also be used for CMMs featuring computed tomography (CT). In this paper, the empirical assessment of the measurement uncertainty of the upcoming measurement technology CT [2, 3] will be discussed uniting the present approaches and the current knowledge, with the focus being on the applicability of concepts for users in industry. For this purpose, the influences on dimensional CT measurements are analyzed and evaluated, taking the measurement data of a current industrial micro CT system as a basis.
引用
收藏
页码:79 / +
页数:2
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