Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction

被引：18

作者：

Lee, Heemin ^{[1
]}

Shin, Jaeyong ^{[1
]}

Cho, Do Hyung ^{[1
]}

Jung, Chulho ^{[1
]}

Sung, Daeho ^{[1
]}

Ahn, Kangwoo ^{[2
]}

Nam, Daewoong ^{[3
]}

Kim, Sangsoo ^{[3
]}

Kim, Kyung Sook ^{[3
]}

Park, Sang-Yeon ^{[3
]}

Fan, Jiadong ^{[4
]}

Jiang, Huaidong ^{[4
]}

Kang, Hyun Chol ^{[5
]}

Tono, Kensuke ^{[6
]}

Yabashi, Makina ^{[7
]}

Ishikawa, Tetsuya ^{[7
]}

Noh, Do Young ^{[2
]}

Song, Changyong ^{[1
]}

机构：

[1] Pohang Univ Sci & Technol, Dept Phys, Pohang 37673, South Korea

[2] Gwangju Inst Sci & Technol, Dept Phys & Photon Sci, Gwangju 61005, South Korea

[3] Pohang Accelerator Lab, PAL XFEL Beamline Div, Pohang 37673, South Korea

[4] ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China

[5] Chosun Univ, Dept Mat Sci & Engn, Gwangju 61452, South Korea

[6] Japan Synchrotron Radiat Res Inst, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan

[7] RIKEN, SPring 8 Ctr, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2020年 / 27卷

基金：

新加坡国家研究基金会; 中国国家自然科学基金;

关键词：

X-ray free-electron lasers; single-particle diffraction; pulse energy; coherence; beam profile; FREE-ELECTRON LASER; EXTREME-ULTRAVIOLET; WAVE-FRONT; COHERENCE; OPERATION;

D O I：

10.1107/S1600577519015443

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

With each single X-ray pulse having its own characteristics, understanding the individual property of each X-ray free-electron laser (XFEL) pulse is essential for its applications in probing and manipulating specimens as well as in diagnosing the lasing performance. Intensive research using XFEL radiation over the last several years has introduced techniques to characterize the femtosecond XFEL pulses, but a simple characterization scheme, while not requiring ad hoc assumptions, to address multiple aspects of XFEL radiation via a single data collection process is scant. Here, it is shown that single-particle diffraction patterns collected using single XFEL pulses can provide information about the incident photon flux and coherence property simultaneously, and the X-ray beam profile is inferred. The proposed scheme is highly adaptable to most experimental configurations, and will become an essential approach to understanding single X-ray pulses.

引用

页码：17 / 24

页数：8

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