Reflection mode X-ray absorption spectroscopy:: new applications in surface science research

被引：9

作者：

Lützenkirchen-Hecht, D

Frahm, R

机构：

[1] Berg Univ Wuppertal, Fachbereich C, Inst Phys Expt, D-42097 Wuppertal, Germany

[2] Berg Univ Wuppertal, Fachbereich C, Inst Mat Wissenschaften, D-42097 Wuppertal, Germany

来源：

PHYSICA B-CONDENSED MATTER | 2005年 / 357卷 / 1-2期

关键词：

EXAFS; solid/liquid interfaces; active dissolution; silver; atomic short-range order;

D O I：

10.1016/j.physb.2004.11.060

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Reflection mode grazing incidence X-ray absorption spectroscopy (GIXAFS) was applied for the in situ investigation of solid/liquid interfaces. Results obtained during the active dissolution of metals are presented. In the case of silver in neutral or weakly acidic Na2SO4 solutions (pH 6.5), the formation of an Ag-O species at the surface of the Ag-electrode can be proven, i.e. the active dissolution proceeds via a non-protecting surface layer, the thickness of which was estimated to be about 5 nm. The atomic short-range order of this surface layer is different from polycrystalline silver oxides (Ag2O and AgO) and relates to a more disordered or amorphous Ag1+ oxide. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：213 / 217

页数：5

共 24 条

[1] THE MECHANISM OF SILVER(I) OXIDE FORMATION ON POLYCRYSTALLINE SILVER IN ALKALINE-SOLUTION - DETERMINATION OF NUCLEATION AND GROWTH-RATES [J].