Effective radii of on-chip decoupling capacitors

被引:58
作者
Popovich, Mikhail [1 ]
Sotman, Michael [3 ]
Kolodny, Avinoam [3 ]
Friedman, Eby G. [2 ]
机构
[1] Qualcomm Corp, CDMA Technol, San Diego, CA 92121 USA
[2] Univ Rochester, Dept Elect & Comp Engn, Rochester, NY 14627 USA
[3] Technion Israel Inst Technol, Dept Elect Engn, IL-32000 Haifa, Israel
基金
美国国家科学基金会;
关键词
decoupling capacitors; power distribution systems; power supply noise; signal integrity;
D O I
10.1109/TVLSI.2008.2000454
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Decoupling capacitors are widely used to reduce power supply noise. On-chip decoupling capacitors have traditionally been allocated into the white space available on a die or placed inside the rows in standard cell circuit blocks. The efficacy of on-chip decoupling capacitors depends upon the impedance of the power/ground lines connecting the capacitors to the current loads and power supplies. A design methodology for placing on-chip decoupling capacitors is presented in this paper. A maximum effective radius is shown to exist for each on-chip decoupling capacitor. Beyond this effective distance, a decoupling capacitor is ineffective. Depending upon the parasitic impedance of the power distribution system, the maximum voltage drop seen at the current load is caused either by the first droop (determined by the rise time) or by the second droop (determined by the transition time). Two criteria to estimate the minimum required on-chip decoupling capacitance are developed based on the critical parasitic impedance. In order to provide the required charge drawn by the load, the decoupling capacitor has to be charged before the next switching cycle. For an on-chip decoupling capacitor to be effective, both effective radii criteria should be simultaneously satisfied.
引用
收藏
页码:894 / 907
页数:14
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