Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

被引：33

作者：

An, Toshu ^{[1
,2
]}

Nishio, Takahiro ^{[1
]}

Eguchi, Toyoaki ^{[1
]}

Ono, Masanori ^{[1
]}

Nomura, Atsushi ^{[1
]}

Akiyama, Kotone ^{[1
,2
]}

Hasegawa, Yukio ^{[1
,2
]}

机构：

[1] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan

[2] Japan Sci & Technol Agcy, Chiyoda Ku, PRESTO, Tokyo 1020075, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 03期

关键词：

D O I：

10.1063/1.2830937

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si (111)-(7 x 7) surface was successfully obtained. (C) 2008 American Institute of Physics.

引用

页数：6

共 31 条

[1] Development of a metal-tip cantilever for noncontact atomic force microscopy [J].

Akiyama, K ;

Eguchi, T ;

An, T ;

Fujikawa, Y ;

Yamada-Takamura, Y ;

Sakurai, T ;

Hasegawa, Y .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (03)

[2] Scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures [J].

Allers, W ;

Schwarz, A ;

Schwarz, UD ;

Wiesendanger, R .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (01) :221-225

[3] Atomically-resolved imaging by frequency-modulation atomic force microscopy using a quartz length-extension resonator [J].

An, TS ;

Eguchi, T ;

Akiyama, K ;

Hasegawa, Y .

APPLIED PHYSICS LETTERS, 2005, 87 (13) :1-3

[4]

BEDA AG, 1967, FIZ TVERD TELA+, V9, P1043

[5]

BREITSCHAFT FJ, 2005, UNPUB 8 INT C NONC A

[6] High resolution atomic force microscopic imaging of the Si(111)-(7x7) surface: Contribution of short-range force to the images - art. no. 256105 [J].

Eguchi, T ;

Hasegawa, Y .

PHYSICAL REVIEW LETTERS, 2002, 89 (26)

[7] Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy [J].

Fukuma, T ;

Kimura, M ;

Kobayashi, K ;

Matsushige, K ;

Yamada, H .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (05)

[8] Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork [J].

Giessibl, FJ .

APPLIED PHYSICS LETTERS, 2000, 76 (11) :1470-1472

[9] Forces and frequency shifts in atomic-resolution dynamic-force microscopy [J].

Giessibl, FJ .

PHYSICAL REVIEW B, 1997, 56 (24) :16010-16015

[10] A LOW-TEMPERATURE ATOMIC FORCE SCANNING TUNNELING MICROSCOPE FOR ULTRAHIGH-VACUUM [J].

GIESSIBL, FJ ;

GERBER, C ;

BINNIG, G .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02) :984-988

← 1 2 3 4 →