Critical oxygen content in porous anodes of solid tantalum capacitors

被引：9

作者：

Pozdeev-Freeman, Y

Rozenberg, Y

Gladkikh, A

Karpovski, M

Palevski, A

机构：

[1] Vishay Israel Elect Co, IL-86000 Dimona, Israel

[2] Tel Aviv Univ, Wolfson Appl Mat Res Ctr, IL-69978 Ramat Aviv, Israel

[3] Tel Aviv Univ, Dept Phys Elect, IL-69978 Ramat Aviv, Israel

[4] Tel Aviv Univ, Sch Phys & Astron, IL-69978 Ramat Aviv, Israel

来源：

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 1998年 / 9卷 / 04期

关键词：

Oxygen Content; Tantalum; Direct Current; Oxygen Level; Powder Particle;

D O I：

10.1023/A:1008884924762

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

X-ray diffraction analysis of sintered porous anodes of solid tantalum capacitors and the current-voltage (I-V) characteristics of Ta2O5 amorphous layers formed on the anode surface have been performed. A strong correlation between a sharp increase of direct current in the I-V characteristics at same critical oxygen content and the creation of a saturated solid-phase solution of oxygen in tantalum was found. The appearance of a crystalline oxide Ta2O5 phase was detected in porous anodes at oxygen contents above the critical oxygen level. The decrease of effective radius below 1 mu m of Ta powder particles used in sintering leads to the size effect: the oxygen content in the porous anode after sintering exceeds the solubility limit. (C) 1998 Kluwer Academic Publishers.

引用

页码：309 / 311

页数：3