共 30 条
- [13] Matsushita Y., 2013, STRUCTURES PHYS PROP
- [17] Fundamentals of developer-resist interactions for line-edge roughness and critical dimension control in model 248 nm and 157 nm photoresists [J]. ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXI, PTS 1 AND 2, 2004, 5376 : 443 - 451
- [18] Polyelectrolyte effects in model photoresist developer solutions [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04): : 1403 - 1410
- [19] Effect of deprotection extent on swelling and dissolution regimes of thin polymer films [J]. LANGMUIR, 2006, 22 (24) : 10009 - 10015
- [20] VERWENDUNG VON SCHWINGQUARZEN ZUR WAGUNG DUNNER SCHICHTEN UND ZUR MIKROWAGUNG [J]. ZEITSCHRIFT FUR PHYSIK, 1959, 155 (02): : 206 - 222