Determination of dielectric relaxation time of Langmuir-films using Maxwell displacement current measurement

被引：0

作者：

Wu, CX ^{[1
]}

Sato, Y ^{[1
]}

Majima, Y ^{[1
]}

Iwamoto, M ^{[1
]}

机构：

[1] Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan

来源：

1998 INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATING MATERIALS, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/ISEIM.1998.741869

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：803 / 806

页数：4

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