Nano-star formation in Al-doped ZnO thin film deposited by dip-dry method and its characterization using atomic force microscopy, electron probe microscopy, photo luminescence and laser Raman spectroscopy

被引:136
作者
Behera, D. [1 ]
Acharya, B. S. [1 ]
机构
[1] Inst Mineral & Mat Technol, Bhubaneswar 751013, Orissa, India
关键词
ZnO thin film; dip-dry method; photoluminescence; laser Raman spectroscopy; atomic force microscopy;
D O I
10.1016/j.jlumin.2008.03.006
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Zinc oxide doped with Al (AZO) thin films were prepared on borosilicate glass substrates by dip and dry technique using sodium zincate bath. Effects of doping on the structural and optical properties of ZnO film were investigated by XRD, EPMA, AFM, optical transmittance, PL and Raman spectroscopy. The band gap for ZnO:Al (5.0 at. wt.%) film was found to be 3.29 eV compared with 3.25 eV band gap for pure ZnO film. Doping with Al introduces aggregation of crystallites to form micro-size clusters affecting the smoothness of the film surface. Al3+ ion was found to promote chemisorption of oxygen into the film, which in turn affects the roughness of the sample. Six photoluminescence bands were observed at 390, 419, 449, 480, 525 and 574 nm in the emission spectra. Excitation spectra of ZnO film showed bands at 200, 217, 232 and 328 nm, whereas bands at 200, 235, 257 and 267 nm were observed for ZnO:Al film. On the basis of transitions from conduction band or deep donors (CB, Zn-i or VOZni) to valence band and/or deep acceptor states (VB, V-Zn or O-i or O-Zn), a tentative model has been proposed to explain the PL spectra. Doping with Al3+ ions reduced the polar character of the film. This has been confirmed from laser Raman studies. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1577 / 1586
页数:10
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