The contribution of vacancies to carbon out-diffusion in silicon

被引:60
作者
Scholz, RF
Werner, P
Gösele, U
Tan, TY
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle, Germany
[2] Duke Univ, Sch Engn, Durham, NC 27708 USA
关键词
D O I
10.1063/1.123081
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diffusion of carbon is mostly assumed to be governed by carbon interstitials via the kick-out mechanism. Carbon in-diffusion experiments are associated with thermal equilibrium concentrations of point defects, whereas in the case of carbon out-diffusion a remarkable undersaturation of Si self-interstitials may develop provided the carbon concentration is several orders of magnitude over its solubility value. New carbon out-diffusion experiments demonstrate that this model qualitatively describes the observed carbon diffusion profiles. However, we demonstrate that an accurate description of the experimental profiles is only possible if the Frank-Turnbull mechanism, involving vacancies, is additionally taken into account. Detailed investigations of carbon and boron profiles in the same sample can be used to determine the splitting of the known vacancy component of the silicon self- diffusion coefficient into the vacancy diffusion coefficient and the vacancy thermal equilibrium concentration at 900 degrees C. (C) 1999 American Institute of Physics. [S0003-6951(99)02202- 0].
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页码:392 / 394
页数:3
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