Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire

被引:30
作者
Dzhigaev, D. [1 ,2 ]
Shabalin, A. [1 ]
Stankevic, T. [3 ]
Lorenz, U. [4 ]
Kurta, R. P. [5 ]
Seiboth, F. [6 ]
Wallentin, J. [7 ]
Singer, A. [8 ]
Lazarev, S. [1 ,9 ]
Yefanov, O. M. [10 ]
Borgstrom, M. [11 ]
Strikhanov, M. N. [1 ]
Samuelson, L. [11 ]
Falkenberg, G. [1 ]
Schroer, C. G. [1 ,12 ]
Mikkelsen, A. [11 ]
Feidenhans'l, R. [3 ]
Vartanyants, I. A. [1 ,2 ]
机构
[1] Deutsch Elektronen Synchrotron DESY, Notkestr 85, D-22607 Hamburg, Germany
[2] Natl Res Nucl Univ, MEPhI, Moscow 115409, Russia
[3] Univ Copenhagen, Niels Bohr Inst, DK-2100 Copenhagen, Denmark
[4] Univ Potsdam, Inst Chem, Karl Liebknecht Strae 24-25, D-14476 Potsdam, Germany
[5] European XFEL GmbH, Albert Einstein Ring 19, D-22761 Hamburg, Germany
[6] Tech Univ Dresden, Inst Struct Phys, D-01062 Dresden, Germany
[7] Lund Univ, Synchrotron Radiat Res, SE-22100 Lund, Sweden
[8] Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA
[9] Natl Res Tomsk Polytech Univ TPU, Pr Lenina 30, Tomsk 634050, Russia
[10] Ctr Free Electron Laser Sci CFEL, Notkestr 85, D-22607 Hamburg, Germany
[11] Lund Univ, Solid State Phys, SE-22100 Lund, Sweden
[12] Univ Hamburg, Dept Phys, Luruper Chaussee 149, D-22761 Hamburg, Germany
关键词
Bragg coherent x-ray diffractive imaging; InP nanowires; strain field; LIGHT-EMITTING-DIODES; CORE-SHELL NANOWIRES; SEMICONDUCTOR NANOWIRES; SOLAR-CELLS; STRAIN; TRANSISTORS; TECHNOLOGY; EFFICIENCY; LIMIT;
D O I
10.1088/2040-8978/18/6/064007
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of +/- 0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires.
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页数:10
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