Numerical approximation of free boundary problem by variational inequalities - Application to semiconductor devices

被引:0
作者
Cecchi, MM [1 ]
Russo, R [1 ]
机构
[1] Univ Padua, Dipartimento Matemat Pura & Applicata, I-35131 Padua, Italy
来源
VARIATIONAL ANALYSIS AND APPLICATIONS | 2005年 / 79卷
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中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
In this paper we treat problem arasing in sermiconductor theory from a mathematical and numerical point of view, in particular we consider a boundary value problem with unknown interfaces arising by the determination of the depletion layer in the most basic semiconductor device namely the p-n junction diode. We present the numerical approximation of free boundary problem with double obstacle treated with quasi-variational inequalities. We deal with the L-infinity convergence of the standard finite element approximation of the system of quasi-variational inequalities.
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页码:697 / 722
页数:26
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