Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method

被引：3

作者：

Hsieh, RC ^{[1
]}

Kuo, JT ^{[1
]}

机构：

[1] Natl Chiao Tung Univ, Dept Commun Engn, Hsinchu 300, Taiwan

来源：

ELECTRONICS LETTERS | 1998年 / 34卷 / 11期

关键词：

D O I：

10.1049/el:19980787

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The fast Hankel transform (FI-IT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.

引用

页码：1110 / 1111

页数：2

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