High-resolution transmission electron microscopy of ion irradiated uranium oxide

被引：46

作者：

Matzke, H ^{[1
]}

Wang, LM ^{[1
]}

机构：

[1] UNIV NEW MEXICO, DEPT EARTH & PLANETARY SCI, ALBUQUERQUE, NM 87131 USA

来源：

JOURNAL OF NUCLEAR MATERIALS | 1996年 / 231卷 / 1-2期

关键词：

D O I：

10.1016/0022-3115(96)00369-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High resolution transmission electron microscopy was used to reveal, for the first time, clear pictures of edge dislocations in UO2, using image filtering in the Fourier space. The same technique was applied to UO2 irradiated with 0.5 MeV Xe-ions. Formation of subgrain boundaries associated with the ending of edge dislocations was observed. The small subgrains of nm size are suggested to act as nuclei for polygonization.

引用

页码：155 / 158

页数：4

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