Hydrogen plasma-mediated modification of the electrical transport properties of ZnO nanowire field effect transistors

被引:13
|
作者
Hong, Woong-Ki [1 ,3 ,4 ]
Yoon, Jongwon [2 ,3 ,4 ]
Lee, Takhee
机构
[1] Korea Basic Sci Inst, Jeonju Ctr, Jeonju 561180, Jeollabuk Do, South Korea
[2] Gwangju Inst Sci & Technol, Sch Mat Sci & Engn, Kwangju 500712, South Korea
[3] Seoul Natl Univ, Dept Phys & Astron, Seoul 151744, South Korea
[4] Seoul Natl Univ, Inst Appl Phys, Seoul 151744, South Korea
基金
新加坡国家研究基金会;
关键词
ZnO nanowire; electrical transport; hydrogen plasma; RAY PHOTOELECTRON-SPECTROSCOPY; OPTICAL-PROPERTIES; FILMS; PHOTODETECTORS; PASSIVATION;
D O I
10.1088/0957-4484/26/12/125202
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We investigated the effects of hydrogen plasma treatment on the electrical transport properties of ZnO nanowire field effect transistors (FETs) with a back gate configuration. After hydrogen plasma treatment of the FET devices, the effective carrier density and mobility of the nanowire FETs increased with a threshold voltage shift toward a negative gate bias direction. This can be attributed to the desorption of oxygen molecules adsorbed on the surface of the nanowire channel, to passivation and to doping effects due to the incorporation of energetic hydrogen ions generated in plasma.
引用
收藏
页数:8
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