Cost-Effective Sub-20 nm Lithography: Smart Chemicals to the Rescue

被引:24
作者
Dammel, Ralph R. [1 ]
机构
[1] AZ Elect Mat, Unit 601 2, Sheung Wan, Hong Kong, Peoples R China
关键词
Photoresist improvement rate; equivalent NA; EUV lithography; Directed Self Assembly (DSA); contact hole shrink; line frequency multiplication; grapho-epitaxy; chemi-expitaxy; BLOCK-COPOLYMERS; POLYMER; POLYSTYRENE; DESIGN; LAYERS;
D O I
10.2494/photopolymer.24.33
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The increasing cost of the lithographic process, which is driven both by process complexity and by the increasing price of moving to smaller exposure wavelengths, makes approaches that use "smart chemicals" and "bottom up" patterning processes that employ molecular scale assembly processes ever more attractive. The technology that is closest to implementation in IC manufacturing is directed self-assembly (DSA) of block copolymers for contact hole shrink and line space multiplication. The current delays and limitations in EUV lithography provide further incentive to pursue DSA technology, which can be both complementary (such as in contact shrink) as well as a competitor (such as for fine line patterning). Current results indicate that DSA structure quality, line roughness measures, and defectivity are in a range that allows development work for integration into existing production to begin. Contact hole shrink may be closest to implementation, since its process integration is very similar to existing shrink material schemes. A first application for line frequency multiplication may be the replacement of multiple patterning processes with DSA schemes which have the potential to provide compelling cost and technical advantages.
引用
收藏
页码:33 / 42
页数:10
相关论文
共 57 条
[1]   Spin-on trilayer approaches to high NA 193nm lithography [J].
Abdallah, D. J. ;
Mckenzie, D. ;
Timko, A. ;
Dioses, A. ;
Houlihan, F. ;
Rahman, D. ;
Miyazaki, S. ;
Zhang, R. ;
Kim, W. ;
Wu, H. ;
PyIneva, L. ;
Lu, P-H. ;
Neisser, M. ;
Dammel, R. R. .
JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2007, 20 (05) :697-705
[2]   Investigation of Polymer-bound PAGs: Synthesis, Characterization and Initial Structure/Property Relationships of Anion-bound Resists [J].
Allen, Robert D. ;
Brock, Phillip J. ;
Na, Young-Hye ;
Sherwood, Mark H. ;
Truong, Hoa D. ;
Wallraff, Gregory M. ;
Fujiwara, Masaki ;
Maeda, Kazuhiko .
JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2009, 22 (01) :25-29
[3]  
[Anonymous], ASML PROMOTIONAL DAT
[4]  
[Anonymous], ASML PRESENTATION FU
[5]   Block copolymers - Designer soft materials [J].
Bates, FS ;
Fredrickson, GH .
PHYSICS TODAY, 1999, 52 (02) :32-38
[6]  
Bencher Chris, 2011, SPIE ADV LITH
[7]  
BRUNNER TA, 1991, P SOC PHOTO-OPT INS, V1466, P297, DOI 10.1117/12.46410
[8]  
Cheng Joy, 2011, SPIE ADV LITH
[9]   Simple and Versatile Methods To Integrate Directed Self-Assembly with Optical Lithography Using a Polarity-Switched Photoresist [J].
Cheng, Joy Y. ;
Sanders, Daniel P. ;
Truong, Hoa D. ;
Harrer, Stefan ;
Friz, Alexander ;
Holmes, Steven ;
Colburn, Matthew ;
Hinsberg, William D. .
ACS NANO, 2010, 4 (08) :4815-4823
[10]   Directed Self-assembly on Sparse Chemical Patterns for Lithographic Applications [J].
Cheng, Joy Y. ;
Nelson, Alshakim ;
Rettner, Charles T. ;
Sanders, Daniel P. ;
Sutherland, Alexander ;
Pitera, Jed W. ;
Na, Young-Hye ;
Kim, Ho-Cheol ;
Hinsberg, William D. .
JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY, 2009, 22 (02) :219-222