Generation of electrical defects in ion beam assisted deposition of Cu(In,Ga)Se2 thin film solar cells

被引:1
作者
Zachmann, H. [1 ]
Puttnins, S. [1 ]
Daume, F. [1 ]
Rahm, A. [1 ]
Otte, K. [1 ]
机构
[1] Solarion AG, DE-04288 Leipzig, Germany
关键词
Cu(In; Ga)Se-2; Solar cells; Polyimide; Capacitance spectroscopy;
D O I
10.1016/j.tsf.2010.12.215
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of Cu(In,Ga)Se-2 (CIGS) absorber layers for thin film solar cells have been manufactured on polyimide foil in a low temperature, ion beam assisted co-evaporation process. In the present work a set of CIGS thin films was produced with varying selenium ion energy. Solar cell devices have been manufactured from the films and characterized via admittance spectroscopy and capacitance-voltage profiling to determine the influence of the selenium ion energy on the electric parameters of the solar cells. It is shown that the impact of energetic selenium ions in the CIGS deposition process leads to a change in the activation energy and defect density and also in the spatial distribution of electrically active defects. For the interpretation of the results two defect models are taken into account. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:7317 / 7320
页数:4
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