Multivariate analysis of pixelated diffraction data

被引：8

作者：

Christodoulou, C. ^{[1
]}

Reid, C. B. ^{[1
]}

O'Flynn, D. ^{[1
]}

Wilson, M. ^{[2
]}

Veale, M. ^{[2
]}

Cernik, R. J. ^{[3
]}

Seller, P. ^{[2
]}

Speller, R. D. ^{[1
]}

机构：

[1] UCL, Dept Med Phys & Bioengn, London WC1E 6BT, England

[2] STFC Rutherford Appleton Lab, Didcot OX11 0QX, Oxon, England

[3] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England

来源：

JOURNAL OF INSTRUMENTATION | 2011年 / 6卷

基金：

英国工程与自然科学研究理事会;

关键词：

Pixelated detectors and associated VLSI electronics; X-ray diffraction detectors; X-RAY-DIFFRACTION;

D O I：

10.1088/1748-0221/6/12/C12027

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A novel pixelated ASIC detector using Cadmium Telluride is applied to a combined energy dispersive- and angular dispersive- X-ray diffraction system. This system is designed to obtain multiple diffraction signatures of powdered materials simultaneously. The diffraction data is analyzed using multivariate partial least squares regression utilizing the diffraction spectra at multiple scatter angles, and material concentration in a three-way regression analysis. The calibration models are used to predict unknown samples, and show that utilizing the angular information can help improve concentration prediction in samples of mixtures and has potential in material identification systems.

引用

页数：7

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