Simulation of Electro-Thermal Runaway and Thermal Limits of a Loaded HVDC Cable

被引:10
作者
Dhayalan, Sathyamoorthy [1 ]
Reddy, C. C. [1 ]
机构
[1] Indian Inst Technol Ropar, Dept Elect Engn, Ropar 140001, India
关键词
Power cables; Integrated circuit modeling; Thermal conductivity; Conductivity; Strips; Electric fields; Load modeling; Electrical-thermal circuit; HVDC cable; load current; thermal limits; thermal runaway; ELECTRIC-FIELD; TEMPERATURE; STEADY;
D O I
10.1109/TPWRD.2021.3112558
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents simultaneous simulation of interdependent electric and thermal fields inside a dc cable under loaded conditions using analogous distributed circuit models for thermal and electrical phenomena. Certain nonlinearities are integrated in such circuit models, leading to simulation of electro-thermal runaway, for the first time, in a dc cable. Using the suggested, nonlinear circuit models, complete dynamics of the temperature profile and electric field inside the cable dielectric can also be obtained under various test and operating conditions until electro-thermal runaway limits in time domain. The results are useful for design and development of dc cables with safety factors, apart from understanding the electro-thermal limits. The models are validated with experimental results, found to be in excellent agreement.
引用
收藏
页码:2621 / 2628
页数:8
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