Large-signal Modeling of SiGe HBT for PA Applications

被引:1
作者
Lee, Tzung-Yin [1 ]
Lee, Sunyoung [1 ]
Zampardi, Pete [1 ]
Kang, Jongchan [1 ]
机构
[1] Skyworks Solut Inc, Irvine, CA 92617 USA
来源
2010 IEEE BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING (BCTM) | 2010年
关键词
SiGe HBT modeling; large-signal modeling; PA design; RF circuit design; DISTORTION;
D O I
10.1109/BIPOL.2010.5667936
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Accurate modeling of large-signal behavior of power amplifiers (PAs) is key in minimizing the number of design spins and design cycle time. This paper presents the 1- and 2-tone large-signal behavior of SiGe HBT with respect to power, frequency, bias, and transistor geometry. While the transistor's weak non-linearity is largely determined by the trans-conductance (Gm) and the quasi-static (QS) charge-storage of the transistor, its high-power large-signal behavior heavily depends on the high-current gain roll-off characteristics and supply clamping. It is discussed from a PA-design standpoint how the SiGe bandgap engineering impacts the large-signal behavior through a steeper gain compression at high currents and high power levels. It is also shown that the 2-tone inter-modulation products of a transistor are closely related to its 1-tone distortion characteristics. Finally an accurate prediction of critical parameters of a practical WCDMA PA was demonstrated with careful accounting of the high-current effects in the SiGe HBT transistor.
引用
收藏
页码:94 / 97
页数:4
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