X-ray based subpicosecond electron bunch characterization using 90 degrees Thomson scattering

被引：151

作者：

Leemans, WP ^{[1
]}

Schoenlein, RW ^{[1
]}

Volfbeyn, P ^{[1
]}

Chin, AH ^{[1
]}

Glover, TE ^{[1
]}

Balling, P ^{[1
]}

Zolotorev, M ^{[1
]}

Kim, KJ ^{[1
]}

Chattopadhyay, S ^{[1
]}

Shank, CV ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,ERNEST ORLANDO LAWRENCE BERKELEY NATL LAB,DIV SCI MAT,BERKELEY,CA 94720

来源：

PHYSICAL REVIEW LETTERS | 1996年 / 77卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.77.4182

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

X rays produced by 90 degrees Thomson scattering of a femtosecond, near infrared, terawatt laser pulse of a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam (e beam) with subpicosecond time resolution. The laser beam was focused onto the e-beam waist, generating 30 keV x rays in the forward direction. The transverse and longitudinal e-beam structures have been obtained by measuring the intensity of the x-ray beam, while scanning the laser beam across the e beam in space and time. The e-beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered x-ray beam.

引用

页码：4182 / 4185

页数：4

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