Microwave Annealing Effect for Highly Reliable Biosensor: Dual-Gate Ion-Sensitive Field-Effect Transistor Using Amorphous InGaZnO Thin-Film Transistor

被引:63
作者
Lee, In-Kyu [1 ]
Lee, Kwan Hyi [2 ]
Lee, Seok [3 ]
Cho, Won-Ju [1 ]
机构
[1] Kwangwoon Univ, Dept Elect Mat Engn, Seoul 139701, South Korea
[2] Korea Inst Sci & Technol, Biomed Res Inst, Seoul 136791, South Korea
[3] Korea Inst Sci & Technol, Sensor Syst Res Ctr, Seoul 136791, South Korea
关键词
microwave annealing; a-InGaZnO; dual gate ISFET; biosensor; reliability; INSTABILITIES; HYSTERESIS; DNA;
D O I
10.1021/am506805a
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We used a microwave annealing process to fabricate a highly reliable biosensor using amorphous-InGaZnO (a-IGZO) thin-film transistors (TFTs), which usually experience threshold voltage instability. Compared with furnace-annealed a-IGZO TFTs, the microwave-annealed devices showed superior threshold voltage stability and performance, including a high field-effect mobility of 9.51 cm(2)/V.s, a low threshold voltage of 0.99 V, a good subthreshold slope of 135 mV/dec, and an outstanding on/off current ratio of 1.18 x 10(8). In conclusion, by using the microwave-annealed a-IGZO TFT as the transducer in an extended-gate ion-sensitive field-effect transistor biosensor, we developed a high-performance biosensor with excellent sensing properties in terms of pH sensitivity, reliability, and chemical stability.
引用
收藏
页码:22680 / 22686
页数:7
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