Educational development for mixed-signal design and test

被引:1
|
作者
Newman, KE [1 ]
Edelstein, G [1 ]
机构
[1] Univ Denver, Denver, CO USA
关键词
D O I
10.1109/ECTC.2003.1216371
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
An overview of course material and internet based modules for multidisciplinary education in the area of mixed signal design and test will be demonstrated. This material may be utilized as part of a one quarter/semester course for an upper division undergraduate technical elective or a graduate specialization. The initial material will demonstrate the fundamental concerns facing designers, and testers who develop systems that integrate analog and digital devices. Optical device interfacing and testing will also be explored to show the expanding nature of this field and the need for design and test standards. Initial lecture material covering mixed signal testing methods and standards are presented and some laboratory experiments are outlined. The background requirements for this course are basic knowledge in electronics, and digital design. Students who do not have, a background in electrical or computer engineering are provided with supplemental review material.
引用
收藏
页码:767 / 769
页数:3
相关论文
共 50 条
  • [41] Workshop concentrates on mixed-signal test
    Electronic Design, 1995, 43 (08):
  • [42] A flexible design methodology for analog test wrappers in mixed-signal SOCs
    Sehgal, A
    Ozev, S
    Chakrabarty, K
    2005 IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS & PROCESSORS, PROCEEDINGS, 2005, : 137 - 142
  • [44] Design and implementation of a mixed-signal boundary scan test bus controller
    Lei, J
    Liu, HL
    Jiang, ZG
    ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings, 2005, : 5821 - 5824
  • [45] Test infrastructure design for mixed-signal SOCs with wrapped analog cores
    Sehgal, A
    Ozev, S
    Chakrabarty, K
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2006, 14 (03) : 292 - 304
  • [46] Design-for-test strategies for analogue and mixed-signal integrated circuits
    Richardson, A
    Olbrich, T
    Liberali, V
    Maloberti, F
    38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2, 1996, : 1139 - 1144
  • [47] Mixed-Signal Instrumentation for Design and Test of 5G Systems
    Jordao, M.
    Cruz, P. M.
    Ribeiro, D.
    Prata, A.
    Carvalho, N. B.
    Vanden Bossche, Marc
    Vye, David
    MICROWAVE JOURNAL, 2017, 60 (04) : 98 - +
  • [48] Automated system-level test development for mixed-signal circuits
    Ozev, S
    Orailoglu, A
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2003, 35 (2-3) : 169 - 178
  • [49] Automated System-Level Test Development for Mixed-Signal Circuits
    Sule Ozev
    Alex Orailoglu
    Analog Integrated Circuits and Signal Processing, 2003, 35 : 169 - 178