Influence of Buffer Layer Surface Morphology on YBCO Critical Current Density Deposited on NiW Tapes

被引：10

作者：

Li, Yijie ^{[1
]}

Liu, Linfei ^{[1
]}

Liu, Huaran ^{[1
]}

Sun, Xiaokun ^{[1
]}

Hong, Dan ^{[1
]}

Xu, Da ^{[1
]}

Wang, Ying ^{[1
]}

机构：

[1] Shanghai Jiao Tong Univ, Dept Phys, Shanghai 200240, Peoples R China

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2011年 / 21卷 / 03期

关键词：

Buffer layers; coated conductors; epitaxial growth; Ni tapes; SUPERCONDUCTING TAPES; COATED CONDUCTORS; FILMS; GROWTH; SINGLE;

D O I：

10.1109/TASC.2010.2083614

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

YBCO thin films were grown on NiW tapes under continuous moving deposition process. All of YBCO layer, buffer layer, and cap layer were deposited in a compact reel-to-reel pulsed laser deposition system. Since high critical current density is the most important and effective factor to improve performance/price ratio of coated conductor for large scale applications, we focused our research work on enhancing critical current density of YBCO layers on NiW substrates. It was found that superconducting transport properties of YBCO layers were dependent on not only in-plane texture but also surface morphology of buffer layers, especially surface structure and large particles along grain boundary in NiW substrates. High quality YBCO layers with > 4.0 x 10(6) A/cm(2) (at 77 K, in zero magnetic field) were fabricated on cap layers with nano-scale surface roughness.

引用

页码：2924 / 2927

页数：4

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