Viscosity of quantized vortices of high-Tc superconductors, La2-xSrxCuO4 as a function of carrier concentration

被引：10
作者：
Maeda, A.
Umetsu, T.
Kitano, H.
机构：
[1] Univ Tokyo, Dept Basic Sci, Meguro Ku, Tokyo 1538902, Japan
[2] JST, CREST, Kawagoe, Saitama 3320012, Japan
来源：
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2007年 / 460卷
关键词：
viscosity; flux flow; LSCO; vortex; doping;
D O I：
10.1016/j.physc.2007.04.095
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have investigated the viscosity of vortices in La2-xSrxCuO4 as a function of carrier doping from x=0.07 to x=0.20. We found that the optimally doped material exhibited the moderately clean nature (l similar to xi, where l is the mean free path of quasi-particles in the core and is the GL coherence length ( similar or equal to core radius)), whereas underdoped materials show smaller viscosity, suggesting some changes exist in the condensate in the underdoped region. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：1202 / 1203
页数：2
相关论文
共 6 条
[1]   UNIFIED THEORY OF EFFECTS OF VORTEX PINNING AND FLUX CREEP UPON THE RF SURFACE IMPEDANCE OF TYPE-II SUPERCONDUCTORS [J].
COFFEY, MW ;
CLEM, JR .
PHYSICAL REVIEW LETTERS, 1991, 67 (03) :386-389
[2]   Critical microwave-conductivity fluctuations across the phase diagram of superconducting La2-xSrxCuO4 thin films [J].
Kitano, H ;
Ohashi, T ;
Maeda, A ;
Tsukada, I .
PHYSICAL REVIEW B, 2006, 73 (09)
[3]   Doping a Mott insulator: Physics of high-temperature superconductivity [J].
Lee, PA ;
Nagaosa, N ;
Wen, XG .
REVIEWS OF MODERN PHYSICS, 2006, 78 (01) :17-85
[4]   Microwave conductivities of high-Tc oxide superconductors and related materials [J].
Maeda, A ;
Kitano, H ;
Inoue, R .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2005, 17 (04) :R143-R185
[5]   An experimental approach to understand dynamical phase diagram of driven vortices of high-Tc superconductors [J].
Maeda, A ;
Togawa, Y ;
Kitano, H .
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2002, 369 (1-4) :177-181
[6]   Electronic state of vortices in YBa2Cu3Oy investigated by complex surface impedance measurements -: art. no. 184517 [J].
Tsuchiya, Y ;
Iwaya, K ;
Kinoshita, K ;
Hanaguri, T ;
Kitano, H ;
Maeda, A ;
Shibata, K ;
Nishizaki, T ;
Kobayashi, N .
PHYSICAL REVIEW B, 2001, 63 (18) :1845171-1845179
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