Quantitative grain growth and rotation probed by in-situ TEM straining and orientation mapping in small grained Al thin films

被引：70
作者：
Mompiou, F. [1 ]
Legros, M.
机构：
[1] CNRS, CEMES, F-31055 Toulouse, France
来源：
SCRIPTA MATERIALIA | 2015年 / 99卷
关键词：
In situ TEM; Orientation mapping; Dislocations; Grain growth; Grain rotation; BOUNDARY MOTION; NANOCRYSTALLINE; DEFORMATION; PLASTICITY; MECHANISMS; NANOINDENTATION; METALS;
D O I：
10.1016/j.scriptamat.2014.11.004
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Despite abundant literature claims of mechanisms involving grain boundaries (GB) mechanisms in the deformation of nanocrystalline metals and alloys, few are actually evidencing them. Experimentally sorting and quantifying these mechanisms adds complexity and remains a challenge. Here we report evidence and quantitative measurements of both grain growth and rotation in response to a tensile strain, in sub-micron grained aluminium thin films. The behavior of several grains was monitored during in-situ transmission electron microscopy (TEM) experiments combining tensile test and crystal orientation mapping. A custom routine was created to discriminate relative GB movements from the rigid body motion of the sample. We also provide evidence that grain rotation results from the motion of intergranular dislocations. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：5 / 8
页数：4
相关论文
共 30 条
[1]   A unified approach to motion of grain boundaries, relative tangential translation along grain boundaries, and grain rotation [J].
Cahn, JW ;
Taylor, JE .
ACTA MATERIALIA, 2004, 52 (16) :4887-4898
[2]  
Chen M., 2005, Science, V308, p356c, DOI DOI 10.1126/SCIENCE.1107143
[3]   The role of confinement on stress-driven grain boundary motion in nanocrystalline aluminum thin films [J].
Gianola, Daniel S. ;
Farkas, Diana ;
Gamarra, Martin ;
He, Mo-rigen .
JOURNAL OF APPLIED PHYSICS, 2012, 112 (12)
[4]   Concurrent grain boundary motion and grain rotation under an applied stress [J].
Gorkaya, Tatiana ;
Molodov, Konstantin D. ;
Molodov, Dmitri A. ;
Gottstein, Guenter .
ACTA MATERIALIA, 2011, 59 (14) :5674-5680
[5]   Stress-driven migration of symmetrical ⟨1 0 0⟩ tilt grain boundaries in Al bicrystals [J].
Gorkaya, Tatiana ;
Molodov, Dmitri A. ;
Gottstein, Guenter .
ACTA MATERIALIA, 2009, 57 (18) :5396-5405
[6]   Grain rotation in thin films of gold [J].
Harris, KE ;
Singh, VV ;
King, AH .
ACTA MATERIALIA, 1998, 46 (08) :2623-2633
[7]   Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing [J].
Idrissi, Hosni ;
Kobler, Aaron ;
Amin-Ahmadi, Behnam ;
Coulombier, Michael ;
Galceran, Montserrat ;
Raskin, Jean-Pierre ;
Godet, Stephane ;
Kuebel, Christian ;
Pardoen, Thomas ;
Schryvers, Dominique .
APPLIED PHYSICS LETTERS, 2014, 104 (10)
[8]   Deformation mechanisms in nanocrystalline palladium at large strains [J].
Ivanisenko, Yu. ;
Kurmanaeva, L. ;
Weissmueller, J. ;
Yang, K. ;
Markmann, J. ;
Roesner, H. ;
Scherer, T. ;
Fecht, H. -J. .
ACTA MATERIALIA, 2009, 57 (11) :3391-3401
[9]   Combination of in situ straining and ACOM TEM: A novel method for analysis of plastic deformation of nanocrystalline metals [J].
Kobler, A. ;
Kashiwar, A. ;
Hahn, H. ;
Kuebel, C. .
ULTRAMICROSCOPY, 2013, 128 :68-81
[10]   Microsample tensile testing of nanocrystalline metals [J].
Legros, M ;
Elliott, BR ;
Rittner, MN ;
Weertman, JR ;
Hemker, KJ .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2000, 80 (04) :1017-1026
123