Orientation of thin liquid crystal films on buffed polyimide alignment layers:: A near-edge x-ray absorption fine structure investigation

被引:18
作者
Weiss, K
Wöll, C
Johannsmann, D
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
[2] Ruhr Univ Bochum, D-44780 Bochum, Germany
[3] Uppsala Univ, Dept Phys, S-75121 Uppsala, Sweden
关键词
D O I
10.1063/1.1287908
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Near-edge x-ray absorption fine structure investigations were performed on thin films of the liquid crystal n-octyl-cyanobiphenyl (8CB) evaporated onto buffed PMDA-ODA polyimide alignment layers and onto highly oriented pyrolytic graphite. The tensor nematic order parameter was derived from the x-ray dichroism as a function of layer thickness and thermal history. The liquid crystal orientation on buffed polyimide is markedly different from that observed on graphite. While on graphite the aromatic rings are oriented parallel to the substrate, there is-on average-a cylindrical symmetry around the molecular main axes for the orientational distribution function of 8CB on polyimide. The main axes are oriented parallel to the substrate in both cases. A brief heat treatment induces desorption of most of the LC material, leaving only the most tightly bound molecules behind. On graphite the remaining 8CB layer is highly oriented, whereas annealing does not significantly change the orientational parameters on polyimide. LC films adsorbed on rubbed polyimide reveal an alignment of the molecular main axes with the rubbing direction. (C) 2000 American Institute of Physics. [S0021-9606(00)71733-8].
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页码:11297 / 11305
页数:9
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