Theory of phase-modulation atomic force microscopy with constant-oscillation amplitude

被引：18

作者：

Hoelscher, Hendrik ^{[1
,2
]}

机构：

[1] Ctr Nanotechnol CeNTech, D-48149 Munster, Germany

[2] Univ Munster, Inst Phys, D-48149 Munster, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 2008年 / 103卷 / 06期

关键词：

D O I：

10.1063/1.2896450

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The recently introduced phase-modulation mode with constant oscillation amplitude is analyzed and compared with the conventional amplitude-modulation technique. We show that instabilities in the amplitude and phase versus distance curves are prevented by the additional feedback controlling the oscillation amplitude. Moreover, we demonstrate that the phase-modulation technique is capable to measure conservative and dissipative tip-sample forces by dynamic force spectroscopy without any jumps caused by instabilities. This feature is an important advantage compared to a spectroscopy technique based on the conventional tapping mode. (c) 2008 American Institute of Physics.

引用

页数：6

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