Performance Enhancement of GaN-Based Light-Emitting Diodes with Magnesium Nitride Inter-Layers

被引:0
作者
Ahn, Su Chang [1 ,2 ]
Baek, Jong Hyeob [1 ]
Kim, Sang-Mook [1 ]
Lee, Byung-Teak [2 ]
机构
[1] Korea Photon Technol Inst KOPTI, Gwangju 500460, South Korea
[2] Chonnam Natl Univ, Dept Mat Sci & Engn, Gwangju 500757, South Korea
基金
新加坡国家研究基金会;
关键词
MgxNy; Surface Texture; Light Extraction Efficiency; Light-Emitting Diodes; X-ray Photoelectron Spectroscopy; EPITAXIAL-LATERAL-OVERGROWTH; DISLOCATION DENSITY; FILMS; LEDS;
D O I
10.1166/jnn.2019.16153
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
High quality GaN epilayers were obtained by using a magnesium nitride (MgxNy) inter-layer. X-ray photoelectron spectroscopy (XPS) reveals Mg 2p core-level spectra from the MgxNy inter-layers. The roughness of the MgxNy layers increased with the growth time, though a prolonged processing time resulted in a decrease in the roughness. A high-resolution X-ray diffraction omega-scan rocking curve was used to reveal that the screw dislocation density (TDD) of GaN with an MgxNy inter-layer was reduced and the crystalline quality of the GaN epitaxial layer was enhanced. Furthermore, the luminous efficiency of an LED with the MgxNy layers was increased by 20% relative to a reference LED.
引用
收藏
页码:1490 / 1493
页数:4
相关论文
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