Hard X-ray Full Field Nano-imaging of Bone and Nanowires at SSRL

被引:8
作者
Andrews, Joy C. [1 ]
Pianetta, Piero [1 ]
Meirer, Florian [1 ]
Chen, Jie [1 ]
Almeida, Eduardo [1 ]
van der Meulen, Marjolein C. H. [1 ]
Alwood, Joshua S. [1 ]
Lee, Cathy [1 ]
Zhu, Jia [1 ]
Cui, Yi [1 ]
机构
[1] SLAC Natl Accelerator Laborator, Stanford Synchrotron Radiat Lightsource, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
来源
SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION | 2010年 / 1234卷
基金
美国国家卫生研究院; 美国国家航空航天局; 美国国家科学基金会;
关键词
X-ray Microscopy; bone; trabecula; nanowires;
D O I
10.1063/1.3463334
中图分类号
O59 [应用物理学];
学科分类号
摘要
A hard X-ray full field microscope from Xradia Inc. has been installed at SSRL on a 54-pole wiggler end station at beam line 6-2. It has been optimized to operate from 5-14 keV with resolution as high as 30 nm. High quality images are achieved using a vertical beam stabilizer and condenser scanner with high efficiency zone plates with 30 nm outermost zone width. The microscope has been used in Zernike phase contrast, available at 5.4 keV and 8 keV, as well as absorption contrast to image a variety of biological, environmental and materials samples. Calibration of the X-ray attenuation with crystalline apatite enabled quantification of bone density of plate-like and rod-like regions of mouse bone trabecula. 3D tomography of individual lacuna revealed the surrounding cell canaliculi and processes. 3D tomography of chiral branched PbSe nanowires showed orthogonal branches around a central nanowire.
引用
收藏
页码:79 / +
页数:2
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