Highly selective growth of AlGaInAs assisted by CBr4 during MOCVD growth

被引:12
作者
Arakawa, S [1 ]
Itoh, M [1 ]
Kasukawa, A [1 ]
机构
[1] Furukawa Elect Corp Ltd, Yokohama Res & Dev Labs, Nishi Ku, Yokohama, Kanagawa 2200073, Japan
关键词
selective growth; AlGaInAs; tetrabromocarbon;
D O I
10.1016/S0022-0248(00)00683-7
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Selective growth of AlGaInAs/InP on masked substrate is investigated by low-pressure metalorganic chemical vapor deposition (MOCVD). Tetrabromocarbon (CBr4) is introduced into the reactor during epitaxial growth as etching gas. The etching action of CBr4 on AlGaInAs grown on planar substrate only affects In atoms, and has little influence on Al and Ga. Selective area growth of AlGaInAs multi-quantum wells (MQWs) on masked substrate is carried out by introducing CBr4 during growth of Al-containing layers except wells. Polycrystals on the dielectric mask decrease with CBr2 flow rate and complete selectivity is achieved with CBr4 flow rate of 3.2 mu mol/min when the growth temperature and the growth rate are 680 degreesC and 30 nm/min, respectively, which correspond to our optimum condition for the growth of AlGaInAs. From the results of photoluminescence and broad-type laser diode of MQW, the introduction of CBr4 does not seem to degrade the crystallinity of AlGaInAs/InP. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:183 / 188
页数:6
相关论文
共 15 条
[1]   Kinetics of carbon tetrachloride decomposition during the metalorganic vapor-phase epitaxy of gallium arsenide and indium arsenide [J].
Begarney, MJ ;
Warddrip, ML ;
Kappers, MJ ;
Hicks, RF .
JOURNAL OF CRYSTAL GROWTH, 1998, 193 (03) :305-315
[2]   Etching of InP-based MQW laser structure in a MOCVD reactor by chlorinated compounds [J].
Bertone, D ;
Campi, R ;
Morello, G .
JOURNAL OF CRYSTAL GROWTH, 1998, 195 (1-4) :624-629
[3]   MODEL FOR IN-SITU ETCHING AND SELECTIVE EPITAXY OF ALXGA1-XAS WITH HCL-GAS BY METALORGANIC VAPOR-PHASE EPITAXY [J].
FUJII, K ;
SHIMOYAMA, K ;
MIYATA, H ;
INOUE, Y ;
HOSOI, N ;
GOTOH, H .
JOURNAL OF CRYSTAL GROWTH, 1994, 145 (1-4) :277-282
[4]   Growth and characterization of heavily carbon doped InGaAs lattice matched to InP by LP-MOCVD using liquid CCl4 [J].
Hong, KS ;
Pavlidis, D .
JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (03) :449-455
[5]   In situ etching of GaAs by AsCl3 for regrowth on AlGaAs in metalorganic vapor-phase epitaxy [J].
Hou, HQ ;
Hammons, BE ;
Breiland, WG .
JOURNAL OF CRYSTAL GROWTH, 1998, 195 (1-4) :199-204
[6]   Comparison of carbon doping of InGaAs and GaAs by CBr4 using hydrogen or nitrogen as carrier gas in LP-MOVPE [J].
Keiper, D ;
Westphalen, R ;
Landgren, G .
JOURNAL OF CRYSTAL GROWTH, 1999, 197 (1-2) :25-30
[7]   CARBON DOPING AND ETCHING OF MOCVD-GROWN GAAS, INP, AND RELATED TERNARIES USING CCL4 [J].
KIBBLER, AE ;
KURTZ, SR ;
OLSON, JM .
JOURNAL OF CRYSTAL GROWTH, 1991, 109 (1-4) :258-263
[8]  
PERRIN SD, 1999, P 11 INT C IND PHOSP, P63
[9]   A COMPARISON OF TMGA AND TEGA FOR LOW-TEMPERATURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION GROWTH OF CCL4-DOPED INGAAS [J].
STOCKMAN, SA ;
HANSON, AW ;
COLOMB, CM ;
FRESINA, MT ;
BAKER, JE ;
STILLMAN, GE .
JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (08) :791-799
[10]  
TAKEMASA K, 1999, P 11 INT C IND PHOSP, P393