Characterization of a direct detection device imaging camera for transmission electron microscopy

被引：39
作者：
Milazzo, Anna-Clare [1 ]
Moldovan, Grigore [2 ]
Lanman, Jason [3 ]
Jin, Liang [1 ]
Bouwer, James C. [1 ]
Klienfelder, Stuart [4 ]
Peltier, Steven T. [1 ]
Ellisman, Mark H. [1 ]
Kirkland, Angus I. [2 ]
Xuong, Nguyen-Huu [1 ]
机构：
[1] Univ Calif San Diego, La Jolla, CA 92093 USA
[2] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
[3] Scripps Res Inst, Dept Mol Biol, La Jolla, CA 92037 USA
[4] Univ Calif Irvine, Irvine, CA 92697 USA
来源：
ULTRAMICROSCOPY | 2010年 / 110卷 / 07期
基金：
英国工程与自然科学研究理事会;
关键词：
Direct detection device; Active pixel sensor; CMOS detectors; MTF; DQE; Transmission electron microscopy; ACTIVE PIXEL SENSORS; CCD CAMERAS;
D O I：
10.1016/j.ultramic.2010.03.007
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 key. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The ODD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：741 / 744
页数：4
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