Grid-Connected PV Inverter Reliability Considerations: A Review

被引：0
作者：
Zhou, Quan [1 ]
Xun, Chunlin [2 ]
Dan, Qiang [2 ]
Liu, Sheng [3 ]
机构：
[1] Huazhong Univ Sci & Technol, China EU Inst Clean & Renewable Energy, Wuhan 430074, Peoples R China
[2] Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, Wuhan 430074, Peoples R China
[3] Wuhan Univ, Sch Power & Mech Engn, Cross Disciplinary Inst Engn Sci, Wuhan, Hubei, Peoples R China
来源：
2015 16TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY | 2015年
关键词：
photovoltaic inverter; reliability; DC-capacitor; insulated gate bipolar transistor; BREAKDOWN; DEGRADATION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
With fast growing application of solar photovoltaic (PV) technology, its reliability is being studied extensively. Note that the photovoltaic inverter is considered as the weakest link of a PV system. This paper, therefore, gives a review on reliability of the grid-connected photovoltaic inverter. The discussion mainly focus on two typical kinds of vulnerable inverter components, i.e., DC-capacitors and insulated gate bipolar transistor switches. The intent of this review is to provide a clear picture of reliability research in photovoltaic inverters. Finally, attempts are made to highlight the direction for future research.
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页数：9
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