Chemical and photochemical processes in sulfide passivation of GaAs(100): In situ optical study and photoemission analysis

被引:25
作者
Berkovits, VL [1 ]
Ulin, VP
Paget, D
Bonnet, JE
L'vova, TV
Chiaradia, P
Lantratov, VM
机构
[1] AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] Ecole Polytech, Lab Phys Mat Condensee, F-91128 Palaiseau, France
[3] Univ Paris Sud, Lab Utilisat Rayonnement Electromagnet, F-91405 Orsay, France
[4] Univ Roma Tor Vergata, I-00133 Rome, Italy
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1998年 / 16卷 / 04期
关键词
D O I
10.1116/1.581377
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We demonstrate a new approach to study semiconductor surface passivation. This approach, which we have applied to the case of GaAs(100) passivation by sodium sulfide water solutions, consists of using both reflectance anisotropy spectroscopy during passivation and ultraviolet photoemission spectroscopy after removing the sample from the solution. We find that (i) complete chemical passivation requires a treatment duration significantly longer than what was used in previous works; in our case, the oxygen contamination is strongly reduced; (ii) photochemical processes play an important role for improving the surface electronic properties. As a result, photoemission spectroscopy, which uses powerful light excitation, may strongly alter the chemical bonds. From experimental evidence and using a chemical model based on first principles estimates, we propose a detailed description both of the surface chemical reactions that occur during passivation and of the chemical bonds that are formed at the semiconductor surface and in the passivating overlayer. (C) 1998 American Vacuum Society. [S0734-2101(98)06104-1].
引用
收藏
页码:2528 / 2538
页数:11
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