Identification of ultra-fine Ti-rich precipitates in V-Cr-Ti alloys irradiated below 300 °C by using positron CDB technique

被引:11
作者
Fukumoto, Ken-ichi [1 ]
Matsui, Hideki [2 ]
Ohkubo, Hideaki [3 ]
Tang, Zheng [2 ]
Nagai, Yasuyoshi [4 ]
Hasegawa, Masayuki [4 ]
机构
[1] Univ Fukui, Grad Sch Nucl Power & Energy Safety Engn, Fukui 9108507, Japan
[2] Tohoku Univ, Mat Res Inst, Sendai, Miyagi 9808577, Japan
[3] Kyoto Univ, Inst Adv Energy, Uji 6110011, Japan
[4] Tohoku Univ, Int Res Ctr Nucl Mat Sci, Oarai, Ibaraki 311313, Japan
关键词
D O I
10.1016/j.jnucmat.2007.06.009
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Irradiation-induced Ti-rich precipitates in V-Ti and V-4Cr-4Ti alloys are studied by TEM and positron annihilation methods (positron lifetime, and coincidence Doppler broadening (CDB)). The characteristics of small defect clusters formed in V alloys containing Ti at irradiation temperatures below 300 degrees C have not been identified by TEM techniques. Strong interaction between vacancy and Ti solute atoms for irradiated V alloys containing Ti at irradiation temperatures from 220 to 350 degrees C are observed by positron lifetime measurement. The vacancy-multi Ti solute complexes in V-alloys containing Ti are definitely identified by using CDB measurement. It is suggested that ultra-fine Ti-rich precipitates or Ti segregation at periphery of dislocation loops are formed in V alloys containing Ti at irradiation temperatures below 300 degrees C. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:289 / 294
页数:6
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