Grazing incidence X-ray studies of ultra-thin Lumogen films

Lumogen(R) Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12 nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than similar to 2 nm) spin-coated films reveal a second, apparently stable crystalline structure. (C) 2007 Elsevier B.V. All rights reserved.