Atomic Scale Investigation of the CuPc-MAPbX3 Interface and the Effect of Non-Stoichiometric Perovskite Films on Interfacial Structures

被引:16
作者
Stecker, Collin [1 ]
Liu, Zhenyu [2 ]
Hieulle, Jeremy [1 ,3 ]
Zhang, Siming [2 ]
Ono, Luis K. [1 ]
Wang, Guofeng [2 ]
Qi, Yabing [1 ]
机构
[1] Okinawa Inst Sci & Technol Grad Univ OIST, Energy Mat & Surface Sci Unit EMSSU, Onna Son, Okinawa 9040495, Japan
[2] Univ Pittsburgh, Dept Mech Engn & Mat Sci, Pittsburgh, PA 15261 USA
[3] Univ Luxembourg, Scanning Probe Microscopy Lab, Phys & Mat Sci Res Unit, Luxembourg, Luxembourg
关键词
metal halide perovskite; scanning tunneling microscopy; density functional theory; copper phthalocyanine; interfacial properties; SCANNING-TUNNELING-MICROSCOPY; HOLE TRANSPORT MATERIAL; CU-PHTHALOCYANINE; SOLAR-CELLS; PERFORMANCE; EFFICIENCY; AU(111); GROWTH; ENERGY; CARBON;
D O I
10.1021/acsnano.1c04867
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Metal halide perovskites (MHPs) have become a major topic of research in thin film photovoltaics due to their advantageous optoelectronic properties. These devices typically have the MHP absorber layer sandwiched between two charge selective layers (CSLs). The interfaces between the perovskite layer and these CSLs are potential areas of higher charge recombination. Understanding the nature of these interfaces is key for device improvement. Additionally, non-stoichiometric perovskite films are expected to strongly impact the interfacial properties. In this study, the interface between CH3NH3PbI3 (MAPbI(3)) and copper phthalocyanine (CuPc), a hole transport layer (HTL), is studied at the atomic scale. We use scanning tunneling microscopy (STM) combined with density functional theory (DFT) predictions to show that CuPc deposited on MAPbX(3) (X = I,Br) forms a self-assembled layer consistent with the alpha-polymorph of CuPc. Additionally, STM images show a distinctly different adsorption orientation for CuPc on nonperovskite domains of the thin film samples. These findings highlight the effect of non-stoichiometric films on the relative orientation at the MHP/HTL interface, which may affect interfacial charge transport in a device. Our work provides an atomic scale view of the MHP/CuPc interface and underscores the importance of understanding interfacial structures and the effect that the film stoichiometry can have on interfacial properties.
引用
收藏
页码:14813 / 14821
页数:9
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